Engineer, Test
Marvell - Chandler, AZ

This job posting is no longer available on Marvell. Find similar jobs: Engineer jobs - Marvell jobs

Experienced test engineer with good handle on test engineering fundamentals.
Applicant must have minimum of 2 years ATE test engineering experience.
Applicant should be familiar with ATE equipment, including Teradyne UltraFlex and Advantest T2000 platforms.
Applicant should be familiar with test program development and debug, particularly with respect to high speed interfaces.
Applicant must have knowledge of system validation fundamentals and have strong programming skills in C/C++/Visual Basic.
Applicant must be able to perform above tasks on multiple simultaneous projects.
Applicant must work well in a team environment.
Excellent English verbal and written skills required.

The Test Engineering team is looking for an experienced test engineer to assist us with developing ATE test programs in multi-core SOC's with many high speed interfaces. Engineer will be responsible for developing ATE test programs for the Teradyne UltraFlex, Advantest T2000, and Verigy 93000 SOC testers. Engineer will also be responsible for developing new methodologies for creatively testing high speed interfaces on the ATE platform. Interfaces include HDMI, DDR3, USB3, SATA, PCIE, MIPI, among others. Applicant should have previous experience with ATE test program development, debug, validation, and correlation with system validation platform.

Applicant should have 2+ years of semiconductor ATE experience.
Applicant must have strong programming skills in C, C++, Visual Basic, and PERL.
Applicant must be able to perform in dynamic, diverse, and fast paced work environment working in with global teams, as well as individually. Excellent English verbal and written skills is a requirement.

Engineering - Manufacturing

Test Engineering

Marvell - 20 months ago - save job - copy to clipboard
About this company
7 reviews
Thou marvell'st at my words, but be thee still; Marvell Technology Group offers digital and mixed-signal integrated circuits for data...