The company specializes in Microscopy, Surface Analysis and Semiconductor Testing services fro a wide range of industries including- semiconductors, lighting, solar, energy storage, defense, image sensors, polymers, catalysts among others.
This individual will be an independent problem solver who will work on FIB and/or STEM's to fill clients' microscopy needs.
Prepare TEM/FIB samples using single beam and dual beam focused ion beam tools.
Obtain bright field , dark field, high resolution, TEM and diffraction patterns prepared by themselves or others in the lab.
Experience with EDS, dedicated STEM, and Hitachi microscopes preferred.
Knowledge of semi-conductor devices a plus.
BS or MS in Materials Science, Chemistry, Physics, or other engineering or science field.
3 years' experience running a (S)TEM or FIB for preparing TEM samples.
On Assignment - 20 months ago